| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6946925 | Microelectronics Reliability | 2012 | 6 Pages |
Abstract
This work presents a novel circuit for detecting transient faults in combinational and sequential logic. The detection mechanism features a built-in current sensor connected to the bulks of the monitored logic. The proposed circuit was optimized in terms of power consumption and enhanced with low-power sleep-mode. In addition, a calibration method for bulk built-in current sensors is presented. Overhead results indicate an increase of only 15% in power consumption which represents an improvement of factor 7 compared to similar existing sensors.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
R. Possamai Bastos, F. Sill Torres, G. Di Natale, M. Flottes, B. Rouzeyre,