| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6946931 | Microelectronics Reliability | 2012 | 5 Pages |
Abstract
New technology development is highlighting the role of stress relaxation inside the semiconductor reliability evaluation. In present paper we focus on the read disturb failure mode, starting from the known model and analysing the impact of stress relaxation on the reliability evaluation. Particular focus has been placed on the infant mortality screening and Burn-In role that is fundamental, especially for an automotive market.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
L. Cola, M. De Tomasi, R. Enrici Vaion, A. Mervic, P. Zabberoni,