| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6946938 | Microelectronics Reliability | 2012 | 6 Pages |
Abstract
⺠We would like to predict complex circuit's behavior under photoelectric stimulation. ⺠For that, it is mandatory to understand first the behavior of elementary devices. ⺠That is why we analyze effects induced by static laser stimulation on MOS capacitors. ⺠Traps are induced in different part of the band gap depending on the substrate type. ⺠It is also shown that electric stress increases the density of such interface traps.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
R. Llido, P. Masson, A. Regnier, V. Goubier, G. Haller, V. Pouget, D. Lewis,