Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6946956 | Microelectronics Reliability | 2012 | 5 Pages |
Abstract
In this work we introduce a cost-aware methodology for selective hardening of combinational logic cells, which provides a list of the most effective candidates for hardening. Two heuristics are proposed in order to define when selective hardening becomes unfeasible. The methodology and the heuristics are applied to a set of benchmark circuits using costs extracted from an actual standard cell library. The results then show that both heuristics might be appropriate for different scenarios.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
S.N. Pagliarini, G.G. dos Santos, L.A. de B. Naviner, J.-F. Naviner,