| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6946963 | Microelectronics Reliability | 2012 | 6 Pages |
Abstract
Specific tests to assess reliability of high luminosity AlInGaP LED for outdoor applications are needed. In this paper tests to propose a model involving three parameters: temperature, humidity and current have been carried out. Temperature, humidity and current accelerated model has been proposed to evaluate the reliability of this type of LED. Degradation and catastrophic failure mechanisms have been analyzed. Finally we analyze the effect of serial resistance in power luminosity degradation.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
E. Nogueira, M. Vazquez, J. Mateos,