| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6947022 | Microelectronics Reliability | 2012 | 5 Pages |
Abstract
A method to evaluate the reliability of the Integrated Circuit without knowing the details of the internal circuit is developed. This method is called Pseudo Black Box testing because the basic knowledge of circuit theory is needed. In this paper, this black box testing is applied to the reliability study of a commercial LED driver and the circuit degradation model is built. The possible failure mechanisms of the LED driver are proposed and verified through failure analysis.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Song Lan, Cher Ming Tan, Kevin Wu,