| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6947064 | Microelectronics Reliability | 2009 | 5 Pages |
Abstract
⺠Some dual-interface chip cards can cause a system crash of card reader terminals. ⺠The terminal failures could be reproduced in the lab by inserting charged cards. ⺠Card discharge pulses were measured with sub-nanosecond temporal resolution. ⺠The total pulse charge as function of peak voltage can distinguish the card types. ⺠The extracted equivalent circuit could be a basis for a charged card model (CCM).
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Gerhard Groos,