| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6947096 | Microelectronics Reliability | 2012 | 4 Pages |
Abstract
In this work we present the implementation of the PEM (Photon Emission Microscopy) techniques as a part of the evaluation of the circuits/blocks which are designed internally by SanDisk engineers or externally by IP (Intellectual Property) vendors. This concept which is applied at the test chip level, is demonstrated via two test cases.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Eddie Redmard, Deny Hanan, Alex Shevachman,