| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6947106 | Microelectronics Reliability | 2012 | 5 Pages |
Abstract
The case study device shows an abnormal electrical behavior after a few years of operation whereas new devices are normal. This abnormal behavior is proved to be related to power supply and temperature, the worst combination being “low” temperature (under 20 °C) and low voltage. We will use the Dynamic Laser Stimulation to identify and localize the specific device structures involved in the defect.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
A. Deyine, E. Doche, F. Battistella, C. Banc,