| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6947110 | Microelectronics Reliability | 2012 | 4 Pages |
Abstract
Lifetime prediction is attempted, on the user side, based on the detectability of the weak population.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Jia Lu, BoCheng Cao, WenShe Wu, YuFeng Dai, ChuangJun Huang, G. Mura,