| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6947117 | Microelectronics Reliability | 2012 | 6 Pages |
Abstract
⺠We proposed a real-time failure imaging system for power devices under power stress. ⺠Scanning Acoustic Tomography (SAT/SAM) is a main apparatus for this system. ⺠The proposed technique was applied to an actual real-time failure analysis. ⺠Die detachment and damage at bonding wire were observed by a movie image.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
A. Watanabe, I. Omura,