| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6947145 | Microelectronics Reliability | 2012 | 4 Pages |
Abstract
Space Domain Reflectometry is a newly developed non-destructive failure analysis technique for localizing open defects by imaging the magnetic field generated by a radio frequency (RF) current induced in the sample. The technique was used to locate a cracked microbump in a daisy chain between two full 725-μm-thick dies.
Related Topics
Physical Sciences and Engineering
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Hardware and Architecture
Authors
J. Gaudestad, V. Talanov, P.C. Huang,