| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6947183 | Microelectronics Reliability | 2012 | 4 Pages |
Abstract
Unpredictable fast failure of blue power InGaN/GaN LEDs is caused by redistribution of In under action of injection currents between nano-scale regions of InGaN alloy with non-equilibrium composition. Unreliable LEDs can be recognized by the increase in forward current values at UÂ <Â 2Â V which is not accompanied by simultaneous reversed current increase during short aging tests (less than 100Â h).
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
A.E. Chernyakov, M.E. Levinshtein, P.V. Petrov, N.M. Shmidt, E.I. Shabunina, A.L. Zakheim,