| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6947246 | Microelectronics Reliability | 2011 | 5 Pages |
Abstract
⺠We present an efficient platform for reliability analysis of digital circuits. ⺠It is based on the fault-injection-fault-analysis approach. ⺠The proposed IP, named FIFA, is fully parameterizable. ⺠Several fault models as well as multiple faults are supported. ⺠FIFA features exceed those reported in the literature in terms of cost and performance.
Related Topics
Physical Sciences and Engineering
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Authors
L.A.B. Naviner, J.-F. Naviner, G.G. Jr., E.C. Marques, N.M. Jr.,