Article ID Journal Published Year Pages File Type
6947247 Microelectronics Reliability 2011 5 Pages PDF
Abstract
► We present a Bayesian model to predict the lifetime of power semiconductors. ► The model includes prior information from experts. ► The model parameters depend strongly on electrical and thermal test conditions. ► The proposed model shows good interpolation quality.
Related Topics
Physical Sciences and Engineering Computer Science Hardware and Architecture
Preview
Applying Bayesian mixtures-of-experts models to statistical description of smart power semiconductor reliability
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