Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6947250 | Microelectronics Reliability | 2011 | 5 Pages |
Abstract
Emerging applications like solar, automotive, railway traction, and nuclear impose to electrical cables increased performances in terms of dependability. Therefore, new tools and procedures are needed to design manufacturing processes for improved reliability and less parameter variability. This paper demonstrates the use of a dedicated simulation tool for 3D dose optimization in electron beam cross-linked cables to quantify the effect of process variability on parameters that are relevant for the product lifetime. The considered process parameters are twist angle and eccentricity of the cable.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
M. Ciappa, L. Mangiacapra, M. Stangoni, S. Ott, W. Fichtner,