Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6947255 | Microelectronics Reliability | 2011 | 4 Pages |
Abstract
⺠We propose the block grading concept and progressive module redundancy technique. ⺠They help to select the best subset among the possible redundant architectures. ⺠The method also utilizes a mixed redundancy implementation. ⺠It presents a shortcut and a better trade-off is achieved.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Tian Ban, Lirida Naviner,