Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6947283 | Microelectronics Reliability | 2011 | 5 Pages |
Abstract
⺠The leakage current decay in MIS structures was investigated. ⺠The devices were subjected to constant-voltage stress. ⺠An equivalent electrical circuit model for the current-time characteristic is reported. ⺠The model is based on an extension of the Curie-von Schweidler law.
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Authors
E. Miranda, C. Mahata, T. Das, C.K. Maiti,