| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6947352 | Microelectronics Reliability | 2011 | 6 Pages |
Abstract
⺠We acquired time-resolved photon emission on 45nm technology structure. ⺠We extract transition pattern information from photon raw database. ⺠An algorithm makes correlation between extracted transition pattern and a simulated one. ⺠Localization of input/output structure and signal propagation delay measurement.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
G. Bascoul, P. Perdu, A. Benigni, S. Dudit, G. Celi, D. Lewis,