| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6947359 | Microelectronics Reliability | 2011 | 4 Pages |
Abstract
⺠The proposed methodology is based on pseudo-Dynamic Photoelectric Laser Stimulation. ⺠We present a new flow to deal with Latch-Up phenomenon issues. ⺠For it we developed a manner to trig Latch-Up allowing localization of sources of it. ⺠This method allowed us localizing a microcontroller's parasitic bipolar transistor.
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Authors
R. Llido, J. Gomez, V. Goubier, N. Froidevaux, L. Dufayard, G. Haller, V. Pouget, D. Lewis,