| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6947382 | Microelectronics Reliability | 2011 | 4 Pages |
Abstract
⺠We propose a FPGA-based solution to perform the variation mapping of a digital value. ⺠The concept was validated on a prototype on a real test-case of defective IC. ⺠The proposed solution is high-speed, high-flexible, low-cost and portable. ⺠The scope of the technique can be extended to any kind of digital or parametric data.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
L. Saury, S. Cany,