| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6947409 | Microelectronics Reliability | 2011 | 5 Pages |
Abstract
⺠Analysis of the degradation of white LEDs, for different operating conditions. ⺠Two different types of state-of-the-art white LEDs were submitted to reliability tests. ⺠Full characterization of the degradation of the package at high temperatures. ⺠Analysis of the degradation of the package reflectivity, as a function of wavelength. ⺠First report of wavelength red-shift after high current stress.
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Authors
M. Dal Lago, M. Meneghini, N. Trivellin, G. Meneghesso, E. Zanoni,