| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6947416 | Microelectronics Reliability | 2011 | 5 Pages |
Abstract
After recalling fundamentals of a recent model, the paper illustrates an application on a real device. The result is the measurement of a number of important parameters, related to physics and technology of a laser diode, which is in turn useful to address the failure analysis in case of degradation.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
M. Vanzi, G. Mura, G. Martines,