Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6947422 | Microelectronics Reliability | 2011 | 5 Pages |
Abstract
Since the DSSCs gain heat during exposure to sunlight increasing its own temperature, we have studied the role of temperature on the degradation of DSSCs. We have performed pure thermal stresses keeping the devices at a constant temperature inside a climatic chamber and monitoring the electrical parameters during stress. We found that temperature alone strongly impacts on the DSSC performances, enhancing the degradation of the sensitizer and then reducing the photo-generated current.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
D. Bari, N. Wrachien, R. Tagliaferro, S. Penna, T.M. Brown, A. Reale, A. Di Carlo, G. Meneghesso, A. Cester,