Article ID Journal Published Year Pages File Type
7730974 Journal of Power Sources 2015 7 Pages PDF
Abstract
Compared with Ni/YSZ-Ov, the Ni/(YSZ + O)-Ov can effectively not only weaken the S adsorption at the interface O vacancy site, but also improve the diffusion of S out of the interface O vacancy. Therefore, the Ni/YSZ + O can help to alleviate the sulfur poisoning at the interface O vacancy site as compared with the Ni/YSZ.228
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Related Topics
Physical Sciences and Engineering Chemistry Electrochemistry
Preview
The sulfur poisoning of the nickel/oxygen-enriched yttria-stabilized zirconia
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