| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9672169 | Microelectronics Reliability | 2005 | 6 Pages |
Abstract
Dynamic Laser Stimulation (DLS) is an important technique for IC analysis and timing characterization. Implementations and practical considerations are presented for SDL, RIL and LADA techniques as well as the latest methodology know as Delay Variation Mapping (DVM). Downside of dynamic laser techniques is higher complexity of IC setup and results interpretation. Understanding these aspects is necessary to benefit from DLS for the IC analysis and timing characterization.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
K. Sanchez, R. Desplats, F. Beaudoin, P. Perdu, J.P. Roux, G. Woods, D. Lewis,