| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9672181 | Microelectronics Reliability | 2005 | 6 Pages |
Abstract
This technique is essentially used for failure root cause research and is particularly interesting when combined with elemental analysis, as it gives high resolution results when performed on thin samples.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
M.-A. Iannello, L. Tsung,