| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9672183 | Microelectronics Reliability | 2005 | 6 Pages |
Abstract
Dynamic Laser Stimulation (DLS) techniques based on near-infrared laser scanning are used for failure analysis, design debug, and time margin studies or critical path analysis. In failure analysis, it is applied to localize defects when static techniques can not be applied. Moving from static to dynamic laser stimulation requires a more complex electrical setup. This paper presents several DLS case studies along with the used DLS setup. It is shown that design-process related issues as well as physical defects such as resistive contacts are rapidly and precisely localized.
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Authors
F. Beaudoin, K. Sanchez, R. Desplats, P. Perdu, J.M. Nicot, J.P. Roux, M. Otte,