| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9672186 | Microelectronics Reliability | 2005 | 4 Pages |
Abstract
We demonstrate isolation of marginal circuits utilizing a probing system with dual time-resolved emission (TRE) and dynamic laser stimulation (DLS) capabilities. Due to design-process interactions, failure of a BIST pattern in random frame buffer I/O cells was causing yield loss. Starting with only the failures' symptoms, we rapidly isolated the problem to a circuit within a PLL, using a PC-based test setup.
Related Topics
Physical Sciences and Engineering
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Hardware and Architecture
Authors
J.Y. Liao, G.L. Woods, X. Chen, H.L. Marks,