| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9672203 | Microelectronics Reliability | 2005 | 7 Pages |
Abstract
Complementarities of this new technique with acoustic microscopy and simulation will be shown for failure prediction applications.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Isaline Richard, Romain Fayolle, Jean-Claude Lecomte,