| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9672205 | Microelectronics Reliability | 2005 | 4 Pages |
Abstract
In this article, a revisit of the Steinberg Model is presented with a direct application on tantalum capacitors populated boards. Experimental results with various sinusoidal excitation g-level are presented; whereas on the other side FEM simulations are performed and results are implemented in the Steinberg Model, in order to identify model parameters.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
A. Dehbi, Y. Ousten, Y. Danto, W. Wondrak,