| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9672217 | Microelectronics Reliability | 2005 | 5 Pages |
Abstract
Experimental results show that this new screening test can indeed screen out the weak reliability diode effectively and improve its reliability by more than 10 folds.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Cher Ming Tan, Joe Chiu, Robert Liu, Guan Zhang,