| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9672220 | Microelectronics Reliability | 2005 | 4 Pages |
Abstract
The use of the MOSFET's embedded body diode in soft-switching applications often leads to the device failure also at reduced power. A non-destructive diagnosis equipment is proposed and employed to systematically investigate the breakdown, as a support to theoretical investigations.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Francesco Iannuzzo,