Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9672323 | Microelectronics Reliability | 2005 | 4 Pages |
Abstract
The electrical conduction of metal-PZT-metal thin-film capacitors depends on the electrode material due to the different magnitudes of the work functions. In this work, Au/PZT/Pt and Pt/PZT/Pt capacitors were fabricated and their electrical properties compared. At the low temperature range of 300-375 K, the electrical conduction of Au/PZT/Pt capacitor is space-charge-limited current (SCLC), whereas Pt/PZT/Pt capacitor shows ohmic conduction at low field (<0.55 MV/cm) and Frenkel-Poole emission at higher fields (⩾0.55 MV/cm). The current level of Au/PZT/Pt is much lower than that of Pt/PZT/Pt at low field (<0.4 MV/cm) due to the larger barrier height for holes of Au/PZT. At high temperatures (375-450 K), the conduction mechanism of Au/PZT/Pt capacitor changes to Schottky emission, whereas that of Pt/PZT/Pt capacitor remains the same as in low temperatures of 300-375 K. The energy band diagrams of the Au/PZT/Pt and Pt/PZT/Pt systems are constructed to explain the different current-voltage characteristics.
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Authors
P.C. Juan, H.C. Chou, J.Y.M. Lee,