| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9672351 | Microelectronics Reliability | 2005 | 12 Pages |
Abstract
We clarify the procedure to improve reliability and to identify the failure mode in order to find for right solutions and recommend a generalized life-stress failure model.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Dongsu Ryu, Seogweon Chang,