Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9672358 | Microelectronics Reliability | 2005 | 7 Pages |
Abstract
Curing kinetics of an epoxy-based underfill material with applications in flip chip ball grid array (FC-BGA) packages has been studied using differential scanning calorimetry (DSC). Non-isothermal DSC curves were obtained with heating rates ranging from 0.5 to 10 °C/min. Glass transition temperature as a function of fractional conversion was determined using temperature modulated DSC. Based on these experimental data, non-linear regression technique was used to evaluate the curing kinetics by considering both chemical- and diffusion-controlled reaction processes. As a result, it was determined that the curing reaction can be described by an nth order autocatalytic reaction partially controlled by diffusion, although the diffusion effect is relatively weak. The obtained optimized kinetic parameters allow us to predict the reaction behavior under various application conditions.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Yi He,