Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10364670 | Microelectronics Reliability | 2015 | 6 Pages |
Abstract
Typically, plots of percent cumulative failure versus failure voltage will be transformed into plots of percent cumulative failure versus lifetime via the above equations. The shapes of these two plots are nearly identical, only the values on the abscissa are changed from (linear) voltage to (logarithmic) lifetime. Since, in this work, the effort was directed at root cause determination of anomalous failures rather than predictions of expected lifetimes, the linear field model was never employed and the data was always plotted as a function of failure voltage.
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Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Justin Parke, Randy Lewis, Kathy Ha, Harlan Cramer, Harold Hearne,