Article ID Journal Published Year Pages File Type
10364670 Microelectronics Reliability 2015 6 Pages PDF
Abstract
Typically, plots of percent cumulative failure versus failure voltage will be transformed into plots of percent cumulative failure versus lifetime via the above equations. The shapes of these two plots are nearly identical, only the values on the abscissa are changed from (linear) voltage to (logarithmic) lifetime. Since, in this work, the effort was directed at root cause determination of anomalous failures rather than predictions of expected lifetimes, the linear field model was never employed and the data was always plotted as a function of failure voltage.
Related Topics
Physical Sciences and Engineering Computer Science Hardware and Architecture
Authors
, , , , ,