A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems

Power consumption and reliability are nowadays the main concerns for nanoelectronic systems. In fact, these factors are closely related, the reliable operation of a system is strongly associated with its power supply voltage (Vdd), frequency of operation, and body biasing. Therefore, power management and fault tolerance techniques need to be jointly implemented to guarantee better overall low-consuming and reliable solutions. This paper presents a novel body built-in cell to address these two issues. It is capable of: 1) detecting short-duration and long-duration transient faults (TF), thus enhancing system's reliability; 2) controlling the circuit's threshold voltage (Vth) through the implementation of adaptive body biasing (ABB) schemes, thus optimizing the system's trade-off between low-power and high performance.