Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
11016473 | Microelectronics Reliability | 2018 | 6 Pages |
Abstract
In this work we specially focused on the application of the two fault isolation techniques, to first, identify the failing flip-flop through dichotomy approach, investigating the macro failure mode through a second harmonic LVI analysis and finally characterizing this failure using LVP.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Emanuele Villa, Audrey Garnier, Antoine Reverdy,