Article ID Journal Published Year Pages File Type
11016531 Microelectronics Reliability 2018 5 Pages PDF
Abstract
This paper investigates two compact thermal model representations for multi-chip power modules, namely the thermal impedance matrix model and the thermal admittance matrix model. The latter can shape a multi-port thermal network without controlled temperature sources, and can be readily implemented in circuit simulators. The mutual transformation between the two models and their relationship to parameters in the multi-port network are revealed. In addition, practical tips for thermal model parameter extractions based on temperature measurements and curve-fitting are discussed. The multi-port thermal model is verified by simulations and experimental results. It confirms that more accurate temperature estimation can be achieved compared with the thermal model without the thermal coupling effect.
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Physical Sciences and Engineering Computer Science Hardware and Architecture
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