There is a limit to everything: Automating AMS operating condition check generation on system-level

We demonstrate our approach using a demodulator circuit of a passive RFID tag. The model is automatically augmented with additional checks derived from an exploration of the underlying circuits' parameter space. By comparing the risk of false-positive simulation results, we prove that the design risk can be significantly reduced. It is eliminated completely by introducing an additional safety-margin, which drives the coverage up to 100%.