Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
4971565 | Microelectronics Reliability | 2017 | 12 Pages |
Abstract
In this work, we have demonstrated that many elements are needed on top of conventional foundry reliability knowledge to enable robust automotive products in compliance with all restrictive norms. For intrinsic reliability, both reliability models (a design compatible WLR description), and dynamic aging compensation schemes are required. For extrinsic failures, screening procedures require well documented usage and are shown in use for volume production to bring the failure rate level down below 1Â ppm automotive target. Altogether, the global approach developed in STMicroelectronics enable robust automotive products based on controlled and validated procedures.
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Hardware and Architecture
Authors
V. Huard, S. Mhira, F. Cacho, A. Bravaix,