| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 4971778 | Microelectronics Reliability | 2016 | 10 Pages |
Abstract
This work presents methods to investigate the influence of age-dependent degradation as well as process-variability on different levels. An operating-point dependent sizing methodology based on the gm/ID-method extended to incorporate aging, which aims at developing aging-resistent circuits is presented. Additionally, the sensitivity of circuit performances in regard to aging can be determined. In order to investigate the reliability of a complex system on behavioral level, a modeling method to represent the performance of system components in dependence of aging and process variability is introduced.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Maike Taddiken, Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen, Steffen Paul,