| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 4971851 | Microelectronics Reliability | 2016 | 5 Pages |
Abstract
After providing a brief introduction to Laser Voltage Probing (LVP), along with useful information and further reading suggestions, this paper provides a deep dive into current benefits and challenges of LVP applied to 16/14Â nm FinFET technology and discusses the issues that arise from scaling of technology nodes according to the International Technology Roadmap for Semiconductors.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Ulrike Ganesh,