Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
4971882 | Microelectronics Reliability | 2016 | 5 Pages |
Abstract
- Inverter-like operated IGBTs showed expected lifetime for short on-period of 60Â ms.
- New test bench concept for heating by forward and switching losses at low DC link voltage
- Dimensioning and required circuitry explained
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
C. Herold, P. Seidel, J. Lutz, R. Bayerer,