Test data compression using interval broadcast scan for embedded cores

The paper proposes a new test data compression scheme for testing embedded cores with multiple scan chains. The new compression scheme allows broadcasting identical test data to several scan chains whenever the cells in the same depth are compatible for the current application test pattern. Thus, it efficiently utilizes the compatibility of the scan cells among the scan chain segments, increases test data run in broadcast mode and reduces test data volume and test application time effectively. It does not need complex compressing algorithm and costly hardware. Experimental results demonstrate the efficiency and versatility of the proposed method.