Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
543225 | Microelectronics Journal | 2014 | 9 Pages |
Abstract
A novel projection-based approach is proposed for constructing compact models of the electro-thermal problems for interconnects. The method is robust since it preserves the non-linear structure of the equations. It is efficient, since it is constructed by determining few moments of the Volterra׳s series expansions of the solution. It leads to compact models of small state-space dimensions which can be numerically solved at negligible computational cost and to accurate approximations of the whole space-time distribution of voltages, currents and temperature rises within the interconnects for all significant waveforms of the injected powers.
Keywords
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Lorenzo Codecasa,