Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6942088 | Integration, the VLSI Journal | 2018 | 15 Pages |
Abstract
To improve leakage power along with better cell stability, a 10â¯T SRAM cell is presented in this paper. Further, the proposed cell is used to implement a 6-input look up table (LUT) of FPGA and a 2â¯kb SRAM macroblock. The proposed cell achieves better results in terms of write static noise margin by 1.66â¯Ãâ¯, 1.8â¯Ãâ¯; read static noise margin by 3.8â¯Ãâ¯, 1.37â¯Ãâ¯; write trip point by 2â¯Ãâ¯, 2â¯Ãâ¯as compared to conventional (C) 6â¯T, read decoupled (RD) 8â¯T SRAM, respectively. The leakage power is also reduced to 0.07â¯Ãâ¯, and 0.43â¯Ãâ¯as compared C6T and RD8T SRAM, respectively at 0.3â¯V VDD.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
P. Singh, B.S. Reniwal, V. Vijayvargiya, V. Sharma, S.K. Vishvakarma,