Article ID Journal Published Year Pages File Type
6946023 Microelectronics Reliability 2018 12 Pages PDF
Abstract
Results show that our method yields very good accuracy in predicting the frequency degradation of cores due to NBTI aging effect, and can be used with confidence when the netlist of the cores is not available.
Keywords
Related Topics
Physical Sciences and Engineering Computer Science Hardware and Architecture
Preview
Empirical derivation of upper and lower bounds of NBTI aging for embedded cores
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