| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6946296 | Microelectronics Reliability | 2016 | 6 Pages |
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Masaki Ohyama, Masatsugu Nimura, Jun Mizuno, Shuichi Shoji, Toshihisa Nonaka, Yoichi Shinba, Akitsu Shigetou,